June 7, 2013, 12:00 pm - 1:00 pm

June 78, 12:00 pm - 1:00 pm

The Energetic Heavy Ion Sensor (EHIS): an Angle Detecting Inclined Sensors (ADIS) Instrument for GOES-R

Jim Connell, University of New Hampshire

The Energetic Heavy Ion Sensor (EHIS), to be flown on the GOES-R series of weather satellites, will measure fluxes of 10-200 MeV protons and heavier ions, helium (He) through nickel (Ni), for energies with comparable penetrations. Using the Angle Detecting Inclined Sensors (ADIS) technique, EHIS will provide single-element charge resolution from protons through Ni. The ADIS technique also allows on-board processing of >2000 events per second in high flux conditions, providing elemental histograms on one minute cadence with exceptional statistics. The first flight model EHIS has been delivered for environmental testing, and has undergone accelerator calibrations at the National Superconducting Cyclotron Laboratory (heavy ions) and Massachusetts General Hospital (protons). Once launched and operational, the instrument will provide new, very high quality measurements of the near-Earth radiation environment.